Oxford Instruments NanoAnalysis

Electron backscatter diffraction and energy dispersive microanalysis for scanning and transmission electron microscopes


Oxford Instruments provides the leading-edge tools that enable nanometre scale imaging, characterization, manipulation and fabrication. Getting the right results in real-time, our technologies include AFM, EDS, EBSD, WDS, EBIC and GIS.


Email: nanoanalysis@oxinst.co.uk
Phone: 44 (0)1494 442255
Fax: 44 (0)1494 461033
Halifax Road
High Wycombe, HP12 3SE
United Kingdom


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Microscopy Online Resources EBSD Electron Backscatter Diffraction Analysis
EDS in the TEM Explained