Bruker Nano Analytics

Bruker Nano Analytics

Electron microscope analyzers (EDS, EBSD, WDS, MXRF, Micro-CT) and micro X-ray fluorescence spectrometers (MXRF, TXRF)


Bruker Nano Analytics (BNA), headquartered at Bruker Nano GmbH in Berlin, Germany, develops, manufactures and markets X-ray systems and components for elemental and structural analysis on the micro and nano scale. BNA's product range of analytical tools for electron microscopes includes: Energy-dispersive X-ray spectrometers (EDS) for scanning and transmission electron microscopes, Wavelength-dispersive X-ray spectrometers (WDS), Electron backscatter diffraction systems (EBSD), Micro-spot X-ray sources for Micro-XRF on SEM and Micro computed tomography (Micro-CT) accessories. BNA’s range of mobile and bench-top micro X-ray fluorescence spectrometers comprises Micro-XRF spectrometers and Total reflection X-ray fluorescence (TXRF) spectrometers.


Phone: +49 (30) 67 09 90-0
Fax: +49 (30) 67 09 90-30
Am Studio 2D
Berlin, 12489


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Microscopy Online Resources High Resolution X-ray Spectroscopy close to Room Temperature
Advances in EBSD Analysis Using Novel Dynamical Pattern Simulation Software