Lehigh Microscopy School


Week long courses on scanning electron microscopy, x-ray microanalysis, scanning transmission electron microscopy, electron backscatter diffraction (EBSD), wavelength dispersive spectroscopy (WDS), and focused ion beam (FIB). Lecturers come from leading research and academic institutions and offer expertise based on years of experience in the laboratory.


Email: slc6@lehigh.edu
Phone: 610-758-5133
5 East Packer Avenue
Bethlehem, PA 18015
United States


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